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Extremely scaled high-k/In0.53Ga0.47As gate stacks with low ...
Industry-standard PEALD of TiN was carried out in a Cambridge Nanotech Fiji F202 system at 250?C us- ing a Tetrakis(dimethylamido)titanium(IV) (TDMAT).
Kinetics Study on the Initial Surface Growth of TiO2 Thin Film Layer ...
... TD/TME) contenant au moins un radical. 3. A quelle preuve ? correspond le ?-terme t ? 4. Cette preuve admet-elle une coupure ? Pourquoi ? Si oui, construire ...
Atomic Layer Deposition for Semiconductors | EPFL
The simplified model is then applied to reproduce experimental results from plasma enhanced ALD process for TiN deposition from. TDMAT and H2-N2 plasma ...
Atomic Layer Deposition - Sigma-Aldrich
In this work, MLD titanium carboxylate thin films are deposited using tetrakis(dimethylamino)titanium(IV) (TDMAT) and various dicarboxylic acid precur- sors: ...
Preuves et Calculs - IRIF
... TD-. MAT, une importante pression de vapeur, une bonne stabilité thermique et une faible viscosité. Le TDMAT a été selectionné comme précurseur de titane car ...
Modeling and Simulation of Atomic Layer Deposition - IuE
In this work we present an in-line x-ray photo- electron spectroscopy (XPS) analysis of the nucleation and growth of ultra-thin (ca. 2 nm) TiO2 ...
Détecteurs gaz portables - SafetyGas
Specifically, the plasma-enhanced ALD (PEALD) process from tetrakis(dimethylamido)titanium (TDMAT) and Ar/H2 plasma pulses was studied. For ...